Feedforward compensation of piezo nonlinearity for high-precision high-speed atomic force microscopy

Researchers have developed a new method to improve the precision and speed of atomic force microscopy (AFM). This technique addresses a common issue where the piezoelectric actuators used in AFM exhibit nonlinear behavior, leading to inaccuracies. By implementing a feedforward compensation strategy, the system can effectively counteract these nonlinearities in real-time.

This advancement allows for more accurate scanning and imaging at higher speeds, which is crucial for detailed nanoscale analysis. The improved performance opens up new possibilities for applications requiring extremely precise measurements.

This innovation is significant because it enhances the capability of atomic force microscopy, a vital tool for nanoscale research and development across various scientific and engineering fields.